Fast, high resolution, inline contactless electrical semiconductor characterization for photovoltaic applications by microwave detected photoconductivity-Reference-Cited by-同舟云学术

Fast, high resolution, inline contactless electrical semiconductor characterization for photovoltaic applications by microwave detected photoconductivity

Published:2013-05 Issue:9 Volume:178 Page:676-681
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Dornich K.,Schüler N.,Berger B.,Niklas J.R.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference24 articles.

1. Proc. 26th EU PVSEC;van Wezep,2011

2. Theoretical and experimental comparison of contactless lifetime measurement methods for thick silicon samples

3. Proc. 24th EU PVSEC;Dornich,2009

4. Lifetime Spectroscopy;Rein,2005

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