Nanostructure and strain analysis of CeO2/YSZ strained superlattice-Reference-Cited by-同舟云学术

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Nanostructure and strain analysis of CeO2/YSZ strained superlattice

Published:2010-10 Issue:1-3 Volume:173 Page:220-228
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Kiguchi Takanori,Konno Toyohiko J.,Wakiya Naoki,Morioka Hitoshi,Saito Keisuke,Shinozaki Kazuo

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference46 articles.

1. Physical and electrical properties of yttria-stabilized zirconia epitaxial thin films deposited by ion beam sputtering on silicon

2. Alternative dielectrics to silicon dioxide for memory and logic devices

3. RF-magnetron-sputtered heteroepitaxial YSZ and CeO2/YSZ/Si(001) thin films with improved capacitance–voltage characteristics

4. Low Temperature Heteroepitaxial Growth of a New Phase Lead Zirconate Titanate Film on Si Substrate with an Epitaxial (ZrO2)1-x(Y2O3)xBuffer Layer

5. Characterization of $\bf Pb(Zr_{\ninmbi x}Ti_{1-{\ninmbi x}})O_{3}$ Thin Film on Silicon Substrate with Heteroepitaxial Yttria-Stabilized Zirconia (YSZ) Buffer Layer

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Strain-induced nanostructure of Pb(Mg1/3Nb2/3)O3–PbTiO3on SrTiO3epitaxial thin films with low PbTiO3concentration;Japanese Journal of Applied Physics;2017-09-28

2. Modeling of complex interfaces: Gadolinium-doped ceria in contact with yttria-stabilized zirconia;Journal of the American Ceramic Society;2017-04-10

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