A control and data handling system for microanalysis using charged particle accelerators-Reference-Cited by-同舟云学术

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A control and data handling system for microanalysis using charged particle accelerators

Published:1982-06 Issue:1 Volume:197 Page:147-156
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Morris J.R.

Publisher

Elsevier BV

Subject

General Engineering

Reference6 articles.

1. Modular instrumentation and digital interface system (CAMAC), IEEE Standard no. 583-1975.

2. Ion beam surface layer analysis;Ziegler,1976

3. Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92,

4. J.R. Morris, to be published.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interactive personal-computer data analysis of ion backscattering spectra;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-02

2. Rutherford Backscattering Spectrometry on Thin Solid Films;Treatise on Materials Science & Technology;1988

3. Physical conditions of computer analysis of ion backscattering;Journal of Applied Physics;1987-09

4. Multidimensional ion microbeam analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1986-04

5. Changing the surface mechanical properties of silicon and α-Al2O3 by ion implantation;Journal of Materials Science;1984-11

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