Author:
Gocłowski M.,Jaskóła M.,Zemło L.
Cited by
11 articles.
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1. Comprehensive method to analyze thick insulating samples using PIXE technique;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-02
2. Residual activity induced by ion bombardment on insulating samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-10
3. Charging effects in thick insulating samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-04
4. PIXE and XRF analysis of honey samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-02
5. Techniques and Equipment;Ion Beans for Materials Analysis;1989