A comparison of secondary ion mass spectrometry and auger electron spectroscopy as surface analytical techniques-Reference-Cited by-同舟云学术

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A comparison of secondary ion mass spectrometry and auger electron spectroscopy as surface analytical techniques

Published:1983-12 Issue:1-3 Volume:218 Page:401-408
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Morgan A.E.

Publisher

Elsevier BV

Subject

General Engineering

Reference53 articles.

1. Electron and ion spectroscopy of solids;Werner,1978

2. Fundamentals and Applications of Auger Electron Spectroscopy

3. Surface analysis with Auger electron spectroscopy

4. Chemical characterization of coatings by analytical techniques sensitive to the surface and near-surface

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TOF-SIMS characterization of impurity enrichment and redistribution in solid oxide electrolysis cells during operation;Dalton Trans.;2014-05-02

2. Auger Spectroscopy;digital Encyclopedia of Applied Physics;2003-04-15

3. Optical Spectroscopy of Condensed Phase Interfaces;Applied Spectroscopy Reviews;1988-09

4. Surface Analysis by Laser Ionization;MRS Bulletin;1987-09

5. Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopy;Analytical Chemistry;1986-04-01

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