Techniques for the compositional and chemical state analysis of surfaces and thin films

Author:

Reuter W.

Publisher

Elsevier BV

Subject

General Engineering

Reference28 articles.

1. Backscattering spectrometry;Chu,1978

2. J.H. Scofield, Lawrence Livermore Laboratory, UCRL-51326.

3. X-rays in atomic and nuclear physics;Dyson,1973

4. Inner-Shell Vacancy Production in Ion-Atom Collisions

5. Developments in secondary ion mass spectroscopy and applications to surface studies

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1. Rutherford backscattering spectrometry for the analysis of atmospheric aerosols;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09

2. Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

3. Recent progress in electron probe microanalysis;Reports on Progress in Physics;1993-04-01

4. Laser ionization of sputtered atoms: Trace analysis of samples with atomic dimensions (Technical Report);Pure and Applied Chemistry;1992-01-01

5. The nuclear microprobe and competing techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-03

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