Multiple-collision analysis of characteristic X-rays from low-energy Ar2+ travelling in solid targets
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference21 articles.
1. Methods of experimental physics;Gray,1980
2. K-Shell Ionization in Heavy-Ion Collisions
3. The excitation of inner shells in slow atomic collisions
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5. Double-Scattering Mechanism to Account for the SiK-X-Ray Yields Observed during Argon-Ion Bombardment of Silicon
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Charge state effect on K-shell ionization of aluminum by 600–3400 keV xenonq+ (12 < q < 29) ion collisions;The European Physical Journal D;2011-08-23
2. Multiple collision analysis of characteristic X-rays from 50 to 600 keV argon stopping in Mg, Al, and Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-05
3. Investigation of dynamical effects for 50–600 keV argon ions stopping in silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04
4. Multiple collision analysis of total cross sections for Ar-L and Mg-K vacancy production measured in slow Ar-Mg collisions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-04
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