Measurement of the low energy tail spectra adjacent to the x-ray photopeak in Si(Li) x-ray detectors
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference6 articles.
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1. Measurement of M-shell X-ray production induced by protons of 0.3–0.7 MeV on W, Au, Pb, Bi, Th and U;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-04
2. Simulations of Si(Li) x-ray detector response;X-Ray Spectrometry;2001
3. M-shell x-ray production cross section measurements in Pb and Bi due to the impact of protons and nickel ions;Journal of Physics B: Atomic, Molecular and Optical Physics;1997-05-28
4. Shape of the two-photon-continuum emission from the1s2s1S0state in He-like krypton;Physical Review A;1997-02-01
5. Improved fitting of PIXE spectra: the Voigt profile and Si(Li) detector modeling;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-04
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