Infra-red faraday rotation in semiconductors: Double beam phase-sensitive method for the measurement of infra-red Faraday rotation, ellipticity and Voigt effect
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Published:1964-03
Issue:1
Volume:4
Page:13-28
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ISSN:0020-0891
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Container-title:Infrared Physics
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language:en
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Short-container-title:Infrared Physics
Author:
Pidgeon C.R.,Smith S.D.
Subject
General Engineering
Cited by
24 articles.
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