An envelope method for determination of the optical constants of absorptive films on absorptive substrates
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference5 articles.
1. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
2. A new method for the determination of the thickness, the optical constants and the relaxation time of weakly absorbing semiconducting thin films
3. Optical constants of tin-telluride determined from infrared interference spectra
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