X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

Published:2000-05 Issue:1-2 Volume:158 Page:134-140
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Chen M,Wang X,Yu Y.H,Pei Z.L,Bai X.D,Sun C,Huang R.F,Wen L.S

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference19 articles.

1. Tin doped indium oxide thin films: Electrical properties

2. A real time ellipsometry study of the growth of amorphous silicon on transparent conducting oxides

3. Effect of hydrogen plasma treatment on transparent conducting oxides

4. Transparent conducting ZnO:Al films deposited on organic substrates deposited by r.f. magnetron-sputtering

5. XPS and X-ray diffraction studies of aluminum-doped zinc oxide transparent conducting films

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