Defect production by the TEM beam—the first application of the positron microprobe

Author:

Männig U,Bennewitz K,Bihr H,Haaks M,Sigle W,Zamponi C,Maier K

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference8 articles.

1. Patent specification `Positronenquelle', submitted to DPA München.

2. Patent specification `Positronenmikroskop', submitted to DPA München.

3. High resolution positron-annihilation spectroscopy with a new positron microprobe

4. H. Greif, M. Haaks, U. Holzwarth, U. Männig, M. Tongbhoyai, K. Maier, ICPA-11, Kansas City, USA (1997).

5. J. Bihr, H. Greif, M. Haaks, U. Holzwarth, B. Huber, U. Männig, M. Tongbhoyai, K. Maier, Optik (1997), 106.

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1. Development of a transmission positron microscope;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2011-07

2. Construction of a positron microbeam in JAEA;Applied Surface Science;2008-10

3. Large Cryogenic Experiments;The Art of Cryogenics;2008

4. Design of a positron microprobe using magnetic lenses;physica status solidi (c);2007-09

5. Design and implementation of a real-time positron imager;SPIE Proceedings;2004-05-18

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