Author:
Stapel D,Thiemann M,Benninghoven A
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference14 articles.
1. Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment
2. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
3. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment
4. T. Crone, R. Ostendorf, M. Thiemann, H.F. Arlinghaus, A. Benninghoven, in: A. Benninghoven et al. (Eds.), Second. Ion Mass Spectrom., SIMS 12, in press.
5. A. Benninghoven, D. Stapel, O. Brox, B. Burkhardt, C. Crone, M. Thiemann, H.A. Arlinghaus, in: A. Benninghoven et al. (Eds.), Second. Ion Mass Spectrom., SIMS 12, in press.
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