Author:
Seah M.P,Spencer S.J,Cumpson P.J,Johnstone J.E
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference11 articles.
1. S. Hofman, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, Vol. 1, Auger and X-ray Photoelectron Spectroscopy, Wiley, Chichester, 1990, p. 143.
2. Auger electron spectroscopy depth profiling during sample rotation
3. Deterministic models of ion erosion, reflection and redeposition
4. Sputtering of compound semiconductor surfaces. I. Ion-solid interactions and sputtering yields
5. Sputtering of compound semiconductor surfaces. II. Compositional changes and radiation-induced topography and damage
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