Atomic resolution imaging and force versus distance measurements on KBr (0 0 1) using low temperature scanning force microscopy-Reference-Cited by-同舟云学术

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Atomic resolution imaging and force versus distance measurements on KBr (0 0 1) using low temperature scanning force microscopy

Published:2002-03 Issue:3-4 Volume:188 Page:238-244
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Hoffmann R.,Lantz M.A.,Hug H.J.,van Schendel P.J.A.,Kappenberger P.,Martin S.,Baratoff A.,Güntherodt H.-J.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference15 articles.

1. Atomic-resolution images of radiation damage in KBr

2. Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory

3. Scanning Force Imaging of Atomic Size Defects on theCaF2(111)Surface

4. Role of image forces in non-contact scanning force microscope images of ionic surfaces

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1. Surface charge dependent structure of ionic liquid/alkali halide interfaces investigated by atomic force microscopy;Japanese Journal of Applied Physics;2022-06-14

2. Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films;Beilstein Journal of Nanotechnology;2018-02-21

3. Imaging prototypical aromatic molecules on insulating surfaces: a review;Reports on Progress in Physics;2017-12-13

4. Low-Temperature Scanning Probe Microscopy;Springer Handbook of Nanotechnology;2017

5. Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces;Surface Science Tools for Nanomaterials Characterization;2015

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