Author:
Crosser M.S.,Tessmer S.H.,Ghosh Ruby N.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Cited by
4 articles.
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1. Electrostatic Fields;Quantitative Data Processing in Scanning Probe Microscopy;2018
2. Electrostatic tip-dielectric sample interaction in electrostatic force microscopy;Revista Facultad de Ingeniería Universidad de Antioquia;2013-03-20
3. Electrostatic Fields;Quantitative Data Processing in Scanning Probe Microscopy;2013
4. Surface charge estimation on hemispherical dielectric samples from EFM force gradient measurements;Journal of Electrostatics;2010-02