Author:
Hayashi S.,Takano A.,Takenaka H.,Homma Y.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference4 articles.
1. Atomic mixing, surface roughness and information depth in high-resolution AES depth profiling of a GaAs/AlAs superlattice structure
2. L. Kiong, A.T.S. Wee, R. Liu, S.L. Lim, in: A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry, SIMS XII, Elsevier, Amsterdam, 1999, p. 421.
3. The complex formation of ripples during depth profiling of Si with low energy, grazing oxygen beams
4. Ion-induced electron emission as a means of studying energy- and angle-dependent compositional changes of solids bombarded with reactive ions
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