Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopy-Reference-Cited by-同舟云学术

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Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopy

Published:1997-04 Issue: Volume:113-114 Page:269-273
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Miura Naruhisa,Ishii Hideaki,Shirakashi Jun-ichi,Yamada Akira,Konagai Makoto

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference14 articles.

1. Application of STM Nanometer-Size Oxidation Process to Planar-Type MIM Diode

2. Tech. Dig. Int. Electron Device Meet.;Matsumoto,1995

3. Abstr. 54th Device Research Conf. (DRC);Shirakashi,1996

4. Fabrication of metallic nanowires with a scanning tunneling microscope

5. Scanning probe tip geometry optimized for metrology by focused ion beam ion milling

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