Corrected confidence intervals based on the signed root transformation for multi-parameter sequentially designed experiments

Author:

Coad D.S.

Publisher

Elsevier BV

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Statistics and Probability

Reference30 articles.

1. Experimental design for binary data;Abdelbasit;Journal of the American Statistical Association,1983

2. Compound D- and DS-optimum designs for determining the order of a chemical reaction;Atkinson;Technometrics,1997

3. Optimum Experimental Designs;Atkinson,1992

4. Asymptotic Techniques for Use in Statistics;Barndorff-Nielsen,1989

5. The Likelihood Principle;Berger,1984

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1. Bias approximations for likelihood‐based estimators;Scandinavian Journal of Statistics;2020-11-24

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