Comparing process-based wheat growth models in their simulation of yield losses caused by plant diseases-Reference-Cited by-同舟云学术

Comparing process-based wheat growth models in their simulation of yield losses caused by plant diseases

Published:2021-05 Issue: Volume:265 Page:108108
ISSN:0378-4290
Container-title:Field Crops Research
language:en
Short-container-title:Field Crops Research

Author:

Bregaglio Simone^ORCID,Willocquet Laetitia,Kersebaum Kurt Christian,Ferrise Roberto,Stella Tommaso,Ferreira Thiago Berton,Pavan Willingthon^ORCID,Asseng Senthold^ORCID,Savary Serge

Funder

INRAE

Federal Ministry of Education and Research Berlin Office

Ministero delle politiche agricole alimentari e forestali

Ministry of Education Youth and Sports of the Czech Republic

Publisher

Elsevier BV

Subject

Soil Science,Agronomy and Crop Science

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