Analysis of surface and bulk material with mass spectrometry-Reference-Cited by-同舟云学术

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Analysis of surface and bulk material with mass spectrometry

Published:1982-12 Issue: Volume:45 Page:35-49
ISSN:0020-7381
Container-title:International Journal of Mass Spectrometry and Ion Physics
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Physics

Author:

Blanchard B.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference32 articles.

1. Trace analysis by mass spectrometry;Franzen,1972

2. Trace analysis by mass spectrometry - potential applications of the spark source and laser probe

3. Element analysis without standards in spark source mass spectrometry with low voltage vacuum arc discharge and automatic photoplate evaluation

4. Polarity of breakdowns and properties of ion beams in the self-triggered mode of damped discharges

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. BISMUTH SUBSTITUTED GARNET FILMS SPUTTERED ON CHROMIUM COATED GLASS SUBSTRATE;Journal of the Magnetics Society of Japan;1991

2. Effects of annealing on highly damaged bubble garnet layers ion implanted with Xe and As;Journal of Applied Physics;1984-03-15

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