Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometry
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference24 articles.
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1. Sputter induced topography on silver coated silicon nitride ceramics by unfocused neutral primary beam selected ion mass spectrometry;International Journal of Mass Spectrometry;1998-06
2. Atomic force microscopy study of sputter-induced topography on silver-coated silicon by a defocused beam of argon neutrals;International Journal of Mass Spectrometry and Ion Processes;1998-01
3. Electrical surface versus bulk properties of Fe-doped TiO2 single crystals;Solid State Ionics;1994-09
4. Quantification of SIMS data for multicomponent glasses;Surface and Interface Analysis;1994-02
5. Charge effects during surface analysis of poorly conducting inorganic materials;Fresenius' Journal of Analytical Chemistry;1991
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