Variance of ion-electron coefficients with atomic number of impacting ions-Reference-Cited by-同舟云学术

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Variance of ion-electron coefficients with atomic number of impacting ions

Published:1976-09 Issue:1-2 Volume:21 Page:1-14
ISSN:0020-7381
Container-title:International Journal of Mass Spectrometry and Ion Physics
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Physics

Author:

Fehn Udo

Publisher

Elsevier BV

Subject

Spectroscopy

Reference22 articles.

1. Discrimination in electron multipliers for atomic ions II. Comparison of yields for 61 atoms

2. Discrimination in electron multipliers for atomic ions 1. Multiplier yields for 24 mass-analyzed ions

3. Isotope effect of ion—electron emission

4. Further observations on positive ion emission from tungsten

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1. Shot noise-mitigated secondary electron imaging with ion count-aided microscopy;Proceedings of the National Academy of Sciences;2024-07-25

2. Variation De La Sensibilité Des Ions Lors De l'analyse D'Une Série D'Alliages Cuivre-Aluminium Par Spectrométrie De Masse À Étincelles;Bulletin des Sociétés Chimiques Belges;2010-09-01

3. Linearity tests for secondary electron multipliers used in isotope ratio mass spectrometry;International Journal of Mass Spectrometry;2001-02

4. Analog gain of microchannel plates for 1.5–154 keV/q Arq+(3⩽q⩽16);Review of Scientific Instruments;1997-08

5. Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils;Physical Review A;1997-02-01

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