Author:
Vasile Michael J.,Malm Donald L.
Cited by
8 articles.
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1. Core ionization and ion ejection during SIMS analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-02
2. Ion-induced noncollisional ejection of positive secondary ions;Surface Science;1991-12
3. A track detector technique for determining ion source emission profiles;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-10
4. Static SIMS for applied surface analysis;Surface and Interface Analysis;1984-02
5. Characterization of Near Surface Composition of Borosilicate Glasses (BSG) by Secondary Ion Mass Spectrometry (SIMS);Journal of The Electrochemical Society;1982-08-01