Measurement of ion residence times in a commercial electron impact ion source
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Published:1974-05
Issue:1
Volume:14
Page:99-106
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ISSN:0020-7381
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Container-title:International Journal of Mass Spectrometry and Ion Physics
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language:en
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Short-container-title:International Journal of Mass Spectrometry and Ion Physics
Author:
Meier K.,Seibl J.
Cited by
16 articles.
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