Automatic Software-Based Self Test Generation for Embedded Processors
Author:
Publisher
Elsevier BV
Subject
Control and Systems Engineering
Reference18 articles.
1. Apostolakis, A., Psarakis, M., Gizopoulos, D., Paschalis, A. and Parulkar, I. (2009). Exploiting thread-level parallelism in functional self-testing of CMT processors. Proc.Proc. of 14th IEEE European Test Symposium ETS 2009, Seville, Spain, May 25-29, 2009, pp. 33-38.
2. The VHDL cookbook;Ashenden,1990
3. Belkin, V. V. and Sharshunov, S. G. (2006). ISA based functional test generation with application to self-test of RISC processors. Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006, pp. 73-74.
4. The software-based self-test of embedded microprocessors;Bernardi,2011
5. Bernardi, P., Sanchez, E., Schillaci, M., Squillero G. and Reorda, M. S. (2006). An evolutionary methodology to enhance processor software-based diagnosis. Proc.Proc. 2006 IEEE Congr. on Evolutionary Computation, Vancouver BC, July 16-21, pp. 859-864.
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1. Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors Cores;IFAC-PapersOnLine;2019
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