Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device

Author:

Putek Piotr,Meuris Peter,Günther Michael,Maten Jan ter,Pulch Roland,Wieers Aarnout,Schoenmaker Wim

Publisher

Elsevier BV

Subject

Control and Systems Engineering

Reference5 articles.

1. Modeling of Layout Aware Line-Edge Roughness and Poly Optimization for Leakage Minimization;Ban;IEEE Journal on Emerging and Selected Topics in Circuits and Systems,2011

2. Total sensitivity based DFM optimization of standard library cells;Ban;Proc. Int. Symp. Phys. Design,2010

3. Incorporating Manufacturing Process Variation Awareness in Fast Design Optimization of Nanoscale CMOS VCOs;Mohanty;IEEE Trans. on Semiconductor. Manuf.,2014

4. Efficient Collocational Approach for Parametric Uncertainty Analysis;Xiu;Communication in Computational Physics,2007

5. MAGWEL NV (2014) http://www.magwel.com/.

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