Electron microscopy investigations of the structure and properties of thin film rigid disks-Reference-Cited by-同舟云学术

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Electron microscopy investigations of the structure and properties of thin film rigid disks

Published:1992-07 Issue:1-3 Volume:113 Page:47-57
ISSN:0304-8853
Container-title:Journal of Magnetism and Magnetic Materials
language:en
Short-container-title:Journal of Magnetism and Magnetic Materials

Author:

Srinivasan D.R,Jones G.A,Grundy P.J

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Electron microscopy on high-coercive-force Co-Cr composite films

2. The effect of Cr underlayer thickness on magnetic and structural properties of CoPtCr thin films

3. Magnetic properties of CoPtCr thin films with 〈112̄0〉 crystal orientation

4. Crystallography and magnetic properties of CoCrTa films prepared on Cr underlayers with different substrate bias conditions

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thin film magnetic recording media;Journal of Physics D: Applied Physics;1998-11-07

2. Magnetic interactions and microstructure in CoCrPt discs;Journal of Magnetism and Magnetic Materials;1996-03

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