Preparation of CoCr films for perpendicular recording by sputter deposition at extremely high Ar pressures
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Co-Cr Perpendicular Anisotropy Films Sputter-Deposited at Very High Ar Gas Pressures and Low Discharge Voltages.
2. Low‐temperature sputter deposition of high‐coercivity Co‐Cr films for perpendicular recording
3. High coercivity in Co-Cr films for perpendicular recording prepared by low temperature sputter-deposition
4. Segregated microstructure in sputtered Co‐Cr film revealed by selective wet etching
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1. Structural study of CoCrPt films by anomalous x-ray scattering and extended x-ray absorption fine structure;Applied Physics Letters;2002-03-04
2. Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak;MRS Proceedings;2002
3. Structure and Magnetic Properties of Co-Cr-M Films with Perpendicular Anisotropy.;Journal of the Magnetics Society of Japan;1999
4. Thin film magnetic recording media;Journal of Physics D: Applied Physics;1998-11-07
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