Chemical interaction at the Pd-B interface
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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4. Thin film and surface characterization by specular X-ray reflectivity;Critical Reviews in Solid State and Materials Sciences;1997-03
5. Growth modes of Pd, Ag, and Si thin films on B;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1995-01
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