Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition-Reference-Cited by-同舟云学术

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Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition

Published:1997-02 Issue: Volume:109-110 Page:359-361
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Alonso J.C.,Diamant R.,Haro-Poniatowski E.,Fernández-Guasti M.,Muñoz G.,Camarillo I.,Jouanne M.,Morhange J.F.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference10 articles.

1. J.P. Huignard and P. Günter in: Photorefractive Materials and Their Applications II, Eds. P. Günter and J.P. Huignard (Springer, Berlin, 1989) p. 215.

2. M.P. Petrov and A.V. Khomenko, in: Photorefractive Materials and Their Applications II, Eds. P. Günter and J.P. Huignard (Springer, Berlin, 1989) p. 325.

3. J.P. Huignard and P. Günter, in: Photorefractive Materials and Their Applications II, Eds. P. Günter and J.P. Huignard (Springer, Berlin, 1989) p. 252.

4. K.E. Youden, R.W. Eason, M.C. Gower and N.A. Vainos, Appl. Phys. Lett. 59 (1991) 1929.

5. R. Ramesh, K. Luther, B. Wilkens, D.I. Hart, E. Wang, J.M. Tarascon, A. Inam, X.D. Wu and T. Venkatesan, Appl. Phys. Lett. 57 ( 1990) 1505.

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