Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference16 articles.
1. Sub-Oxide Thin Films For An Optical Recording Disk
2. TeOxthin films for an optical disc memory
3. Effective medium analysis of TeOxoptical storage layers
4. Laser recording in tellurium suboxide thin films
5. Optical Recording Materials Based on TeOxFilms
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spectroscopic ellipsometric modeling of a Bi–Te–Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction;Thin Solid Films;2014-10
2. Carbon/Ternary Alloy/Carbon Optical Stack on Mylar as an Optical Data Storage Medium to Potentially Replace Magnetic Tape;ACS Applied Materials & Interfaces;2013-08-21
3. Short-Wavelength Recording Properties of TeO x Thin Films;Chinese Physics Letters;2004-02
4. Study on the recording mechanism of TeO x thin film;SPIE Proceedings;2003-04-09
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