Influence of tip size on AFM roughness measurements
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference15 articles.
1. Atomic force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure
2. Identification and visualization of questionable regions in atomic force microscope images
3. Three‐dimensional probe reconstruction for atomic force microscopy
4. Correction of surface roughness measurements in SPM imaging
5. Effect of tip shape on surface roughness measurements from atomic force microscopy images of thin films
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