Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal–metal interfaces-Reference-Cited by-同舟云学术

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Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal–metal interfaces

Published:2003-10 Issue:1-2 Volume:219 Page:28-38
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Smith R.J.,Ramana C.V.,Choi Bum-sik,Saleh Adli A.,Shivaparan N.R.,Shutthanandan V.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference25 articles.

1. First principles modeling of magnetic random access memory devices (invited)

2. Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)

3. Alloy formation at the Ni–Al interface for nickel films deposited on Al(110) surfaces

4. Room temperature growth of thin Fe films on Al(001) and Al(110) surfaces

5. Composition and structure of the Co–Al interface for thin Co films deposited on Al(001) and Al(110) surfaces at room temperature

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure of V thin films on Al(100) using XPD, LEED, and LEIS;Surface Science;2012-08

2. Fe-Al interface intermixing and the role of Ti, V, and Zr as a stabilizing interlayer at the interface;Journal of Applied Physics;2009-03

3. Thermal and chemical stability of epitaxial Fe films grown on the Ti-stabilized Al(100) surface;Surface Science;2008-01

4. Structure of ultrathin Ag films on theAl(100)surface;Physical Review B;2006-09-18

5. Atomistic modeling of Ag deposition on the low-index faces of Al and Al deposition on Ag;Surface Science;2005-06

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