Time-of-flight-SIMS and XPS characterization of metal doped polymers-Reference-Cited by-同舟云学术

Time-of-flight-SIMS and XPS characterization of metal doped polymers

Published:2003-01 Issue: Volume:203-204 Page:575-579
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Gross Th.,Retzko I.,Friedrich J.,Unger W.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference8 articles.

1. I. Retzko, Ph.D. Thesis, Freie Universität Berlin, 2001.

2. ISO TC201/SC7 N23 Draft 2: ISO Standard: Surface Chemical Analysis—X-ray Photoelectron Spectrometers—Calibration of Energy Scales, 1996.

3. Standard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy E 1523–93, in: Annual Book of ASTM Standards, Vol. 03.06, ASTM, West Conshohocken, USA, 1996, p. 913.

4. G. Beamson, D. Briggs, High Resolution XPS of Organic Polymers, Wiley, Chichester, 1992, p. 26.

5. XPS valence band analysis of plasma-treated polymers

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