Author:
Kikukawa Atsushi,Hosaka Sumio
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference7 articles.
1. Characterization of semiconductor materials and devices using acoustoelectric voltage measurement
2. J.H. McFee, in: E.B. Tucker, D.I. Bolef, L.N. Liebermann, J. de Klerk, A.V. Granato, K. Lücke, G.A. Alers, W.P. Mason, J.R. Peverley (Eds.), Physical Acoustics, Vol. 4A, Academic Press, New York, 1966.
3. Kelvin probe force microscopy
4. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
5. Applications of an atomic force microscope voltage probe with ultrafast time resolution