Nitrogen quantification with SNMS-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Nitrogen quantification with SNMS

Published:1999-04 Issue: Volume:144-145 Page:31-35
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Goschnick J,Natzeck C,Sommer M

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference5 articles.

1. Accuracy of the elemental quantification with plasma-based SNMS for complex environmental material

2. H. Oechsner in: H. Oechsner (Ed.), Thin film and depth profile analysis, Top Cur. Phys., Vol. 37, Springer, Berlin, 1984, pp. 48–62.

3. Quantitative depth profile and bulk analysis with high dynamic range by electron gas sputtered neutral mass spectrometry

4. J. Schuricht, Wissenschaftliche Berichte FZKA 5529, Forschungszentrum Karlsruhe, 1994.

5. Quantitative analysis of ionic solids by secondary neutral mass spectrometry

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanocrystalline alanates—Phase transformations, and catalysts;Journal of Alloys and Compounds;2005-12

2. Atomic mass spectrometry;Journal of Analytical Atomic Spectrometry;2000

3. Comparison of spring and autumn time collected outdoor aerosol particles analyzed with depth-resolving SNMS;Applied Surface Science;1999-04

4. Industrial analysis: metals, chemicals and advanced materials;Journal of Analytical Atomic Spectrometry;1999

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP