Determination of the transmission and correction of electron spectrometers, based on backscattering and elastic reflection of electrons-Reference-Cited by-同舟云学术

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Determination of the transmission and correction of electron spectrometers, based on backscattering and elastic reflection of electrons

Published:1999-04 Issue: Volume:144-145 Page:101-105
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Gergely G,Menyhard M,Sulyok A,Toth J,Varga D,Tokesi K

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference27 articles.

1. D. Briggs, M.P. Seah, Practical Surface Analysis, Vol. 1, Wiley, 1990.

2. A system for the intensity calibration of electron spectrometers

3. Quantitative aes: the problems of the energy dependent phase shift and modulation amplitude and of the non-ideal behaviour of the channel electron multiplier

4. Channel electron multiplier efficiencies: the effect of the pulse height distribution on spectrum shape in auger electron spectroscopy

5. ASTM Standard E 1016-90.

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