Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage-Reference-Cited by-同舟云学术

Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Published:1999-04 Issue:1-4 Volume:142 Page:591-597
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Komolov Alexei,Schaumburg Kjeld,Møller Preben J,Monakhov Vadim

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference22 articles.

1. H.S. Nalwa (Ed.), Handbook of Organic Conductive Molecules and Polymers, Wiley, New York, 1997.

2. J.P. Farges (Ed.), Organic Conductors, Marcel Dekker, New York, 1994, pp. 495–689.

3. J.P. Aime, in: H.S. Nalwa (Ed.), Handbook of Organic Conductive Molecules and Polymers, Wiley, New York, 1997, pp. 219–250.

4. N. Larsen, T. Bjørnholm, J. Garnaes, J. Larsen, K. Schaumburg, in: M.E. Welland, J.K. Gimzevski (Eds.), Ultimate Limits of Fabrication and Measurement, Kluwer Academic Press, Dordrecht, 1995, pp. 205–212.

5. W.R. Salaneck, in: T.A. Skotheim (Ed.), Handbook of Conducting Polymers, Marcel Dekker, New York, 1986, pp. 1337–1365.

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