XPS studies on silicide formation in ion beam irradiated Au/Si system-Reference-Cited by-同舟云学术

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XPS studies on silicide formation in ion beam irradiated Au/Si system

Published:1997-11 Issue:1-2 Volume:120 Page:159-164
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Sarkar D.K,Bera Santanu,Dhara S,Nair K.G.M,Narasimhan S.V,Chowdhury S

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference20 articles.

1. Metastable Au-Si alloy formation induced by ion-beam interface mixing

2. Fundamental aspects of ion beam mixing

3. Ion-induced silicide formation in niobium thin films

4. When is thermodynamics relevant to ion-induced atomic rearrangements in metals?

5. Diffuse interface in Si (substrate)‐Au (evaporated film) system

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