Czochralski growth and characterization of piezoelectric single crystals with langasite structure: La3Ga5SiO14 (LGS), La3Ga5.5Nb0.5O14 (LGN) and La3Ga5.5Ta0.5O14 (LGT) II. Piezoelectric and elastic properties

Author:

Bohm J.,Chilla E.,Flannery C.,Fröhlich H.-J.,Hauke T.,Heimann R.B.,Hengst M.,Straube U.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference13 articles.

1. Czochralski growth and characterization of piezoelectric single crystals with langasite structure: La3Ga5SiO14 (LGS), La3Ga5.5Nb0.5O14 (LGN), and La3Ga5.5Ta0.5O14 (LGT)

2. M. Bohm, J. Bohm, Proceedings of the 15th European Crystallographic Meeting (ECM-15) in Dresden 28.8.–2.9.1994 (Abstract S.575). R.Oldenbourg, München, 1994.

3. IEEE Standard on Piezoelectricity. ANSI/IEEE Standards 176-1987, New York 1988, pp. 1–53.

4. Electromechanical properties of thin ferroelectric Pb(Zr0.53Ti0.47)o3-layers

5. W. Kleber, H.-J. Bautsch, J. Bohm, Einführung in die Kristallographie. 18.Aufl., Technik, Berlin, 1998, pp. 270 ff., 319 ff.

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