Non-destructive evaluation of nanoscopic subsurface features in fabricated samples-Reference-Cited by-同舟云学术

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Non-destructive evaluation of nanoscopic subsurface features in fabricated samples

Published:2015 Issue:1 Volume:64 Page:503-506
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

Edward Kert,Farahi Faramarz

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference13 articles.

1. Near Field Scanning Optical Microscopy (NSOM): Development and Biophysical Applications;Betzig;Biophysical Journal,1986

2. Near-Field Scanning Optical Microscopy;Dunn;Chemical Reviews,1999

3. Near-Field Scanning Optical Microscopy, A Siren Call to Biology;Edidin;Traffic,2001

4. Cell Biology Beyond the Diffraction Limit: Near-Field Scanning Optical Microscopy;De Lange;Journal of Cell Science,2001

5. Near-Field Scanning Optical Microscopy;Buratto;Current Opinion in Solid State and Materials Science,1996

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