Annealing of the Co/Hf bilayer on single Si, polycrystalline Si and SiO2-Reference-Cited by-同舟云学术

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Annealing of the Co/Hf bilayer on single Si, polycrystalline Si and SiO2

Published:2000-07 Issue:1-2 Volume:100 Page:17-23
ISSN:0165-0270
Container-title:Journal of Neuroscience Methods
language:en
Short-container-title:Journal of Neuroscience Methods

Author:

Kim Eun-Taek,Kwon Youngjae,Lee Chongmu

Publisher

Elsevier BV

Subject

General Neuroscience

Reference16 articles.

1. Byun JS, Cho HJ, Kim HJ, Kim WS, Choi M, Chun D. In: Processings of VMIC Conference, Santa Clara, CA, June 1993. p. 478.

2. Byun JS. Ph.D. Thesis, Seoul National University, 1993.

3. Growth of epitaxial CoSi2on (100)Si

4. El-Diwany M, Borland J, Chen J, Hu S, Wijnen PV, Vorst C, Akylas V, Brassington M, Razuok R. IEDM Tech. Dig., 1989. p. 245.

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