Surface interface structural studies of CH3NH3PbI3 thin films using synchrotron source X-ray diffraction for solar cell application
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Published:2022
Issue:
Volume:64
Page:1837-1843
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ISSN:2214-7853
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Container-title:Materials Today: Proceedings
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language:en
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Short-container-title:Materials Today: Proceedings
Author:
Hasan Z. Inamul,
Joshi SiddharthORCID,
K. M. Subbaya,
Parameshwara S.
Reference30 articles.
1. S.Zh. Karazhanov, A.G. Ulyashin, Similarity of electronic structure and optical properties of Mg2NiH4 and Si,EPL, 82 (4) (2008) 48004, https://doi.org/10.1209/0295-5075/82/48004.
2. Hydride electronics, phys. stat. sol;Karazhanov;(a),2007
3. SmagulKarazhanov, Lianghuan Feng, Application of bromide-iodide lead perovskite thin film as a copper-free back contact layer for CdTe solar cells;Zhou;Sol. Energy,2021
4. Relationships between Lead Halide Perovskite Thin-Film Fabrication, Morphology, and Performance in Solar Cells;Sharenko;J. Am. Chem. Soc.,2016
5. SmagulZhKarazhanov, Visible light-assisted instability of kesterite Cu2ZnSnS4: What are the implications?;Kois;Sol. Energy Mater. Sol. Cells,2020
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