Microstructural characterization of BN thin films using RF magnetron sputtering method
-
Published:2020
Issue:
Volume:26
Page:2277-2282
-
ISSN:2214-7853
-
Container-title:Materials Today: Proceedings
-
language:en
-
Short-container-title:Materials Today: Proceedings
Author:
Singh Mukhtiar,
Vasudev HiteshORCID,
Kumar Ravinder
Cited by
66 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献