Growth and characterization of Ag-Cu2O thin films: DC magnetron sputtering method-Reference-Cited by-同舟云学术

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Growth and characterization of Ag-Cu2O thin films: DC magnetron sputtering method

Published:2020 Issue: Volume:27 Page:486-491
ISSN:2214-7853
Container-title:Materials Today: Proceedings
language:en
Short-container-title:Materials Today: Proceedings

Author:

Nagendra Vara Prasad M.,Munikrishna Reddy Y.

Publisher

Elsevier BV

Subject

General Medicine

Reference12 articles.

1. Y. Munikrishna Reddy, M. Nagendra Vara Prasad, R. Padma Suvarna, S. Parveena, NCETSTM 2K14, 2014, ISBN: 9789383038206.

2. M. Nagendra Vara Prasad, R. Jeevan Kumar, Y. Munikrishna Reddy, Research Article 2017, 2(9), Advanced Materials, DOI: 10.5185/amp.2017/616, 2017, pp 593-595.

3. M. Nagendra Vara Prasad, Y. Munikrishna Reddy, R. Jeevan Kumar, Int. J. Eng. Res. Appl., ISSN : 2248-9622, Vol. 7, Issue 10, (Part -5) 2017, pp.11–14.

4. M. Nagendra Vara Prasad, Y. Munikrishna Reddy, R. Jeevan Kumar, ICRAAP-2017, Annamalai University, T.N, 2017, 10-11.

5. P-type electrical conduction in transparent thin films of CuAlO2

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1. Preparation of cuprous oxide-supported silver-modified reduced graphene oxide nanocomposites for non-enzymatic electrochemical sensor;Reviews in Analytical Chemistry;2022-01-01

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