High temperature radiative properties of thin polysilicon films at the λ = 0.6328 μm wavelength-Reference-Cited by-同舟云学术

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High temperature radiative properties of thin polysilicon films at the λ = 0.6328 μm wavelength

Published:1993-11 Issue:17 Volume:36 Page:4163-4172
ISSN:0017-9310
Container-title:International Journal of Heat and Mass Transfer
language:en
Short-container-title:International Journal of Heat and Mass Transfer

Author:

Xu Xianfan,Grigoropoulos Costas P.

Publisher

Elsevier BV

Subject

Fluid Flow and Transfer Processes,Mechanical Engineering,Condensed Matter Physics

Reference22 articles.

1. Polycrystalline Silicon for Integrated Circuit Applications;Kamins,1988

2. Assessment of silicon on insulator technologies for VLSI;Tsaur,1986

3. Polycrystalline silicon micromachining;Howe,1985

4. Optical Properties of Thin Solid Films;Heavens,1955

5. Principles of Optics;Born,1980

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