Synchrotron white beam topographic imaging in grazing Bragg-Laue geometries-Reference-Cited by-同舟云学术

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Synchrotron white beam topographic imaging in grazing Bragg-Laue geometries

Published:1990-09 Issue:3 Volume:2 Page:195-213
ISSN:0895-3996
Container-title:Journal of X-Ray Science and Technology
language:en
Short-container-title:Journal of X-Ray Science and Technology

Author:

Yao G

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiology, Nuclear Medicine and imaging,Instrumentation,Radiation

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural investigation of MOVPE-grown GaAs on Ge by x-ray techniques;Semiconductor Science and Technology;2012-10-04

2. Femtosecond versus nanosecond laser micro-machining of InP: a nondestructive three-dimensional analysis of strain;Semiconductor Science and Technology;2007-07-19

3. The Characterization of Defects in Silicon Carbide Crystals by X-Ray Topography in the Back-Reflection Geometry;Defect and Diffusion Forum;2004-11

4. Silicon Carbide Crystals — Part I;Crystal Growth Technology;2003

5. On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge–Si heterostructure;Applied Physics Letters;2000-09-11

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