Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
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1. Characterisation of the VG ESCALAB instrumental broadening functions by XPS measurements at the Fermi edge of silver;Journal of Electron Spectroscopy and Related Phenomena;1997-05
2. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
3. Imaging XPS?A new technique, I?principles;Surface and Interface Analysis;1983-02
4. Bulk and Surface Studies by Reflection Low Energy Electron Loss Spectroscopy;Physics of Solid Surfaces;1982