A parametric method applied to phase recovery from a fringe pattern based on a genetic algorithm
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Interferogram Analysis: Digital Fringe Measurement Techniques;Robinson,1993
2. Interferogram Analysis for Optical Testing;Malacara,1998
3. Optical Shop Testing;Malacara,1992
4. Interferogram Analysis;Creath,1993
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